Spectroscopy in the analysis of bacterial and eukaryotic cell footprints on implant surfaces
1 Department of Medicine, Institute of Clinical Medicine, Helsinki University Central Hospital, Finland
2 Department of Electronics, School of Electrical Engineering, Aalto University, Finland
3 Department of Materials Science and Engineering, Chair for Surface Science and Corrosion, Friedrich-Alexander-University of Erlangen-Nüremberg, Germany
4 Department of Bacteriology and Immunology, Haartman Institute, University of Helsinki, Finland
5 Department of Oral Medicine, Institute of Dentistry, University of Helsinki
6 Department of Oral and Maxillofacial Diseases, Helsinki University Central Hospital, Finland
7 The University of Manchester, Manchester Academic Health Science Centre, School of Translational Medicine and University Hospital of South Manchester, UK
8 Department of Applied Physics, Kuopio Campus, University of Eastern Finland, Kuopio, Finland
9 ORTON Orthopaedic Hospital of the ORTON Foundation, Helsinki, Finland
10 COXA Hospital for Joint Replacement, Tampere, Finland
Abstract
We tested the suitability of two spectroscopic methods, x-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), in the recognition of bacterial and eukaryotic cell footprints on implant surfaces. Human mesenchymal stem cells (MSCs) andStaphylococcus aureuswere cultured on sample surfaces and detached using trypsin. Scanning electron microscopy confirmed that the processed surfaces did not contain any human or microbial cells. The footprints were then analysed using XPS and ToF-SIMS. XPS results showed no significant differences between the footprints, but principal component analysis of the ToF-SIMS data enabled clear separation of MSC-footprints from theS. aureusand co-culture footprints (p< 0.03). ToF-SIMS also demonstrated ‘race for the surface’ between proteins, which suggest surface charge (zeta-potential) dependent protein adsorption. ToF-SIMS differentiated eukaryotic and bacterial footprints and has potential forpost-hocdetection of implant-related infections based on the typical ToF-SIMS spectra.
Keyword
- Bacterial infection; time of flight secondary ion mass spectrometry; x-ray photoelectron spectroscopy
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